Microwave characterisation of superconducting materials: what accuracy can be achieved in surface resistance measurements using the Hakki-Coleman dielectric resonators?

Author

Mazierska, Janina ; Leong, Kenneth ; Jacob, Mohan

Author_Institution

Electr. & Comput. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia

fYear

2000

fDate

2000

Firstpage

608

Lastpage

611

Abstract

This paper discusses accuracy of loss measurements of High Temperature Superconductors (HTS) using the Hakki-Coleman sapphire resonator. Possible sources of errors in R_s measurements are presented and evaluated. It has been shown that in order to minimise ΔR_s/R_s errors the fractional power ratios should be below 0.1. This can be achieved by appropriate aspect ratio of the sapphire and the cavity to sapphire diameter ratio. For optimised designs errors in R_s measurements can be as small as 1.5 times the measurement error in the Q₀-factor even for 100% uncertainty in tanδ

Keywords

dielectric resonators; electric resistance measurement; high-temperature superconductors; loss measurement; measurement errors; microwave measurement; sapphire; Al₂O₃; HTSC; Hakki-Coleman dielectric resonators; Hakki-Coleman sapphire resonator; Q₀-factor; R_s measurements; aspect ratio; fractional power ratios; high temperature superconductors; loss measurements; measurement error; microwave characterisation; superconducting materials; surface resistance measurements; Copper; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Electrical resistance measurement; High temperature superconductors; Superconducting films; Superconducting materials; Surface resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2000 Asia-Pacific

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6435-X

Type

conf

DOI

10.1109/APMC.2000.925908

Filename

925908