DocumentCode :
1745752
Title :
Phenomenological model for the microwave surface resistance of the high temperature superconductors
Author :
Srivastava, G.P. ; Daya, K.S. ; Tyagi, G.S. ; Das, V.G.
Author_Institution :
Dept. of Electron. Sci., Delhi Univ., India
fYear :
2000
fDate :
2000
Firstpage :
612
Lastpage :
616
Abstract :
This paper presents a simple empirical model based on the two fluid model that explains the occurrence of anomalous low temperature microwave resistive peaks in high temperature superconductors. One of the key features is the presence of impurities in the sample, which affect the magnitude and position of the surface resistance peak resulting in different power losses at different impurity levels. Thus the appropriate doping concentration can control these power losses
Keywords :
electric resistance; high-temperature superconductors; impurities; microwave materials; modelling; anomalous low temperature microwave resistive peaks; doping concentration; empirical model; high temperature superconductors; impurities; impurity level; microwave surface resistance; phenomenological model; power losses; surface resistance peak; two fluid model; Charge carriers; Conducting materials; Conductivity; Fabrication; High temperature superconductors; Impurities; Scattering; Superconducting transition temperature; Superconductivity; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2000 Asia-Pacific
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6435-X
Type :
conf
DOI :
10.1109/APMC.2000.925909
Filename :
925909
Link To Document :
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