DocumentCode
1746035
Title
Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber
Author
Park, Y. ; Ahn, T.-J. ; Kim, Y.H. ; Han, W.-T. ; Paek, U.-C. ; Kim, D.Y.
Author_Institution
Dept. of Inf. & Commun., Kwangju Inst. of Sci. & Technol., South Korea
Volume
2
fYear
2001
fDate
17-22 March 2001
Abstract
A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8 pm.
Keywords
aluminium; boron; erbium; germanium; internal stresses; optical fibre testing; optical polarisers; photoelasticity; stress measurement; B-Ge doped fiber; Er-Al doped fiber; optical fiber; photoelastic effect profile; photoelastic effect profiles; residual stress measurement; residual stress profile; spatial resolution; Fiber lasers; Optical fiber devices; Optical fiber polarization; Optical fibers; Optical refraction; Optical variables control; Photoelasticity; Refractive index; Residual stresses; Stress measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fiber Communication Conference and Exhibit, 2001. OFC 2001
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-55752-655-9
Type
conf
Filename
927349
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