• DocumentCode
    174606
  • Title

    Updates of the ITRS design cost and power models

  • Author

    Smith, Graeme

  • Author_Institution
    Gary Smith EDA, Santa Clara, CA, USA
  • fYear
    2014
  • fDate
    19-22 Oct. 2014
  • Firstpage
    161
  • Lastpage
    165
  • Abstract
    Design cost and power/energy have been major challenges for the semiconductor industry over the past decade or more. Increase in gate count, driven by scaling of physical dimensions per Moore´s Law, has dramatically increased the diversity of integrated functions and overall design complexity. To control design cost and schedule in light of limited human and computing resources, design productivity must be continually improved. The International Technology Roadmap for Semiconductors (ITRS) Design Chapter [10], which provides a design technology roadmap to inform the electronic design automation (EDA) industry and internal CAD organizations, has since 2001 maintained a design cost model that tracks implications for SOC design cost of anticipated design productivity improvements. The power/energy challenge stems from a variety of causes, e.g., high-performance functional requirements, non-ideal scaling of supply voltages, interconnect capacitances, and leakage currents. The ITRS Design Chapter has since 2009 also roadmapped low-power design technologies that address the power challenge. This paper provides an updated overview of the ITRS design cost model, as well as the low-power design technology roadmap along with associated technology solutions. Potential design technology solutions to mitigate design cost and power/energy challenges in the coming decade are also noted.
  • Keywords
    costing; integrated circuit design; low-power electronics; semiconductor industry; ITRS design cost; International Technology Roadmap for Semiconductors; design cost control; design cost model; design productivity; design technology solutions; electronic design automation; energy challenge; integrated functions; internal CAD organization; nonideal scaling; overall design complexity; power models; Hardware; Integrated circuits; Logic gates; Productivity; Software; Technological innovation; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2014 32nd IEEE International Conference on
  • Conference_Location
    Seoul
  • Type

    conf

  • DOI
    10.1109/ICCD.2014.6974676
  • Filename
    6974676