DocumentCode :
1746371
Title :
Hot wire inspection using eddy current
Author :
Jin-Su Bae ; Kim, Sang-young
Author_Institution :
Instrum. & Control Res. Group, Tech. Res. Labs., South Korea
Volume :
2
fYear :
2001
fDate :
2001
Firstpage :
962
Abstract :
The configurations of the ECT (Eddy Current Tester) system in hot-wire and rod line comprise a guiding device, a tester (Defectomat CS) and a very efficient computer system for data acquisition and processing. The difficulties due to lack of straightness and vibration when feeding wire to test coils have been solved with a guiding device designed by POSCO (Pohang Iron & Steel Co. Ltd). The data processor is designed to process an analog signal for the smallest evaluation units. In addition to assessing an individual defect with an eddy current signal, statistical considerations of the signal make it possible to detect periodically occurring flaws. The test results in the user monitor are represented by colored bars and those of the previous coils remain on the screen until the next coil has been completely tested, which makes it possible to identify quality trends by comparing the coils. After experimenting with a defected billet having artificial hole or broken roll, the ECT system is at use on the wire and rod line of POSCO
Keywords :
automatic test equipment; data acquisition; eddy current testing; flaw detection; inspection; Defectomat CS; computer system; data acquisition; data processing; eddy current signal; eddy current tester; guiding device; hot wire inspection; periodically occurring flaws; quality trends identification; Coils; Data acquisition; Eddy current testing; Eddy currents; Electrical capacitance tomography; Inspection; Iron; Steel; System testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
ISSN :
1091-5281
Print_ISBN :
0-7803-6646-8
Type :
conf
DOI :
10.1109/IMTC.2001.928222
Filename :
928222
Link To Document :
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