Title :
Influence of dispersion properties of the delay line in self heterodyne linewidth measurements
Author :
Ndi, F.C. ; Toulouse, J. ; Pattnaik, R.K. ; McIntosh, C. ; Yeniay, A.
Author_Institution :
Dept. of Phys., Lehigh Univ., Bethlehem, PA, USA
Abstract :
We report experimental results of the influence of 1/f noise on the laser linewidth measurements using the self heterodyne technique and suggest a method of isolating it from the dispersive broadening caused by the delay line in the interferometer.
Keywords :
1/f noise; Mach-Zehnder interferometers; fibre optic sensors; heterodyne detection; laser beams; laser noise; laser variables measurement; light interferometry; optical delay lines; optical fibre dispersion; semiconductor lasers; 1/f broadening; 1/f noise; CW laser line shape; delay line; dispersion properties; dispersive broadening; interferometer; laser linewidth measurements; self heterodyne linewidth measurements; self heterodyne technique; semiconductor laser; Delay lines; Dispersion; Fiber lasers; Frequency; Laser noise; Low-frequency noise; Optical interferometry; Power lasers; Semiconductor device noise; Semiconductor lasers;
Conference_Titel :
Optical Fiber Communication Conference and Exhibit, 2001. OFC 2001
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-655-9
