DocumentCode :
1746689
Title :
Resolution in model-based measurement
Author :
Van Den Bos, A.
Author_Institution :
Dept. of Phys., Delft Univ. of Technol., Netherlands
Volume :
1
fYear :
2001
fDate :
21-23 May 2001
Firstpage :
295
Abstract :
In measurement practice, the concept of resolution is usually associated with the ability to distinguish two overlapping components of the same kind in observations. The original concept, Rayleigh´s well-known two-point resolution, stems from optics. If is based on the presumed limits of the human visual system to distinguish the images of two closely located point sources in observations of the sum of the images. Modern definitions of resolution, on the other hand, are based on parametric statistical models of the observations. They implicitly assume the use of parameter estimation methods and show that the ultimate limits to resolution are nonsystematic (statistical) and systematic (modeling) errors
Keywords :
bifurcation; measurement errors; measurement theory; modelling; parameter estimation; probability; Rayleigh two-point resolution; model-based measurement; nonsystematic errors; overlapping components; parameter estimation methods; parametric statistical models; probability; resolution concept; sine square model; singularity theory; systematic errors; ultimate limits to resolution; Bandwidth; Humans; Image resolution; Instruments; Modems; Parameter estimation; Physics; Probability; Transfer functions; Visual system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
ISSN :
1091-5281
Print_ISBN :
0-7803-6646-8
Type :
conf
DOI :
10.1109/IMTC.2001.928829
Filename :
928829
Link To Document :
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