DocumentCode
1746689
Title
Resolution in model-based measurement
Author
Van Den Bos, A.
Author_Institution
Dept. of Phys., Delft Univ. of Technol., Netherlands
Volume
1
fYear
2001
fDate
21-23 May 2001
Firstpage
295
Abstract
In measurement practice, the concept of resolution is usually associated with the ability to distinguish two overlapping components of the same kind in observations. The original concept, Rayleigh´s well-known two-point resolution, stems from optics. If is based on the presumed limits of the human visual system to distinguish the images of two closely located point sources in observations of the sum of the images. Modern definitions of resolution, on the other hand, are based on parametric statistical models of the observations. They implicitly assume the use of parameter estimation methods and show that the ultimate limits to resolution are nonsystematic (statistical) and systematic (modeling) errors
Keywords
bifurcation; measurement errors; measurement theory; modelling; parameter estimation; probability; Rayleigh two-point resolution; model-based measurement; nonsystematic errors; overlapping components; parameter estimation methods; parametric statistical models; probability; resolution concept; sine square model; singularity theory; systematic errors; ultimate limits to resolution; Bandwidth; Humans; Image resolution; Instruments; Modems; Parameter estimation; Physics; Probability; Transfer functions; Visual system;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location
Budapest
ISSN
1091-5281
Print_ISBN
0-7803-6646-8
Type
conf
DOI
10.1109/IMTC.2001.928829
Filename
928829
Link To Document