• DocumentCode
    1746689
  • Title

    Resolution in model-based measurement

  • Author

    Van Den Bos, A.

  • Author_Institution
    Dept. of Phys., Delft Univ. of Technol., Netherlands
  • Volume
    1
  • fYear
    2001
  • fDate
    21-23 May 2001
  • Firstpage
    295
  • Abstract
    In measurement practice, the concept of resolution is usually associated with the ability to distinguish two overlapping components of the same kind in observations. The original concept, Rayleigh´s well-known two-point resolution, stems from optics. If is based on the presumed limits of the human visual system to distinguish the images of two closely located point sources in observations of the sum of the images. Modern definitions of resolution, on the other hand, are based on parametric statistical models of the observations. They implicitly assume the use of parameter estimation methods and show that the ultimate limits to resolution are nonsystematic (statistical) and systematic (modeling) errors
  • Keywords
    bifurcation; measurement errors; measurement theory; modelling; parameter estimation; probability; Rayleigh two-point resolution; model-based measurement; nonsystematic errors; overlapping components; parameter estimation methods; parametric statistical models; probability; resolution concept; sine square model; singularity theory; systematic errors; ultimate limits to resolution; Bandwidth; Humans; Image resolution; Instruments; Modems; Parameter estimation; Physics; Probability; Transfer functions; Visual system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
  • Conference_Location
    Budapest
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-6646-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2001.928829
  • Filename
    928829