Title :
FFT test of A/D converters to determine the integral nonlinearity
Author :
Adamo, Francesco ; Attivissimo, Filippo ; Giaquinto, Nicola ; Savino, Mario
Author_Institution :
Dept. of Electr. & Electron., Polytech.. of Bari, Italy
Abstract :
The use of the FFT test to derive the integral nonlinearity (INL) of A/D converters is examined. The derived INL is a linear combination of Chebyshev polynomials, where the coefficients are the spurious harmonics of the output spectrum. The accuracy of the test is examined theoretically, in simulations and in practical devices, particularly for the critical (and typical) case when sudden jumps are present in the actual INL. The examined methodology appears to be very convenient when the device under test has high resolution (16-20 bits) and a smoothed approximation of the INL is sufficient, as the FFT test is in this case thousands of times faster than the customary histogram test and static nonlinearity test
Keywords :
Chebyshev approximation; analogue-digital conversion; discrete Fourier transforms; integrated circuit testing; polynomial approximation; signal sampling; transfer functions; A/D converters; Chebyshev polynomials; DFT; FFT test; high resolution; integral nonlinearity; linear combination; output spectrum; simulation; smoothed approximation; spurious harmonics; static nonlinearity; transfer function; Chebyshev approximation; Nonlinear equations; Phase measurement; Polynomials; Quantization; Signal resolution; Testing; Transfer functions;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.928911
