Title :
Instability and dynamics of thermal runaway of thermoresistive microsensors
Author :
Brandão, G.B. ; de Almeida, L.A.L. ; Deep, G.S. ; Lima, A.M.N. ; Neff, H.
Author_Institution :
Dept. of Electr. Eng., Univ. Federal da Paraiba, Campina Grande, Brazil
Abstract :
Under specific biasing conditions the characteristics of thermoresistive sensors become nonlinear. A significant feature is the appearance of thermal runaway. In this paper, the conditions of appearance and the dynamics of this phenomenon have been evaluated by simulations and by experiments. The origin of thermal instability is electrothermal feedback and results from sensor biasing. Under the condition of negative electrothermal feedback the sensor response is faster, while for destructive positive feedback, response times and sensor temperature increase to large values that exceed the range of practical use
Keywords :
feedback; microsensors; temperature sensors; thermal resistance; biasing conditions; destructive positive feedback; negative electrothermal feedback; response times; sensor biasing; sensor temperature; thermal instability; thermal runaway; thermoresistive microsensors; Delay; Electrothermal effects; Mechanical sensors; Microsensors; Negative feedback; Sensor phenomena and characterization; Temperature sensors; Thermal sensors; Thermoresistivity; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929450
