Title :
Noise study on thick film resistors
Author :
Hajdu, Istvan ; Kincses, Zsolt
Author_Institution :
Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Hungary
Abstract :
Electronic noise is an important characteristic of any circuit. This paper describes a noise measurement method which is used to study some types of thick film resistors. In the framework of this study, we concentrate on comparative studies of the layer technology and use of different materials. The paper introduces the measurement method and shows some results for Ag and Cu based pastes along with some trimming results
Keywords :
electric noise measurement; electron device noise; electron device testing; machining; thick film resistors; Ag; Ag based pastes; Cu; Cu based pastes; electronic noise; layer technology; measurement method; noise; noise measurement method; resistor materials; resistor trimming; thick film resistors; Battery charge measurement; Circuit noise; Frequency; Heat treatment; Low-frequency noise; Noise generators; Noise measurement; Resistors; Temperature; Thick films;
Conference_Titel :
Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
Conference_Location :
Calimanesti-Caciulata
Print_ISBN :
0-7803-7111-9
DOI :
10.1109/ISSE.2001.931045
