DocumentCode :
174714
Title :
PRATHAM: A power delivery-aware and thermal-aware mapping framework for parallel embedded applications on 3D MPSoCs
Author :
Kapadia, Nishit ; Pasricha, Sudeep
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
fYear :
2014
fDate :
19-22 Oct. 2014
Firstpage :
525
Lastpage :
528
Abstract :
In emerging 3D-ICs, thermal hotspots and high IR-drops in the power delivery network (PDN) can significantly limit overall system performance. The high core counts required to support parallel embedded applications in these 3D-ICs also notably increases communication energy. As inter-core communication patterns, IR-drop distributions, and 3D thermal profiles all influence system performance and power, it is critical that a system-level application mapping framework consider their combined effect. In this paper, for the first time, we propose a system-level parallel embedded application allocation framework (PRATHAM) that integrates a holistic solution evaluation methodology while considering the impact of network-on-chip (NoC) communication, drops in supply voltage, and the on-chip thermal profile on overall system performance, and co-optimizes on-chip IR-drop, thermal, and communication profiles, for improved overall system performance and lower energy consumption. Our experimental results indicate that PRATHAM reduces energy-delay-squared product (ED2P) by up to 43.6% over recently proposed PDN-aware and thermal-aware 3D-mapping frameworks, respectively.
Keywords :
integrated circuit interconnections; multiprocessing systems; power aware computing; system-on-chip; three-dimensional integrated circuits; 3D MPSoC; 3D thermal profiles; 3D-IC; ED2P; IR-drop distributions; NoC communication; PDN; PRATHAM; energy-delay-squared product; holistic solution evaluation methodology; intercore communication patterns; network-on-chip communication; on-chip thermal profile; parallel embedded applications; power delivery network; supply voltage drops; system-level application mapping framework; system-level parallel embedded application allocation framework; thermal hotspots; Analytical models; Benchmark testing; Computational modeling; Measurement; System-on-chip; Thermal analysis; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design (ICCD), 2014 32nd IEEE International Conference on
Conference_Location :
Seoul
Type :
conf
DOI :
10.1109/ICCD.2014.6974733
Filename :
6974733
Link To Document :
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