Title :
Real-time inspection system for printed circuit boards
Author :
Kim, Nam-Hyeong ; Pyun, Jae-Young ; Choi, Kang-Sun ; Choi, Byeong-Doo ; Ko, Sung-Jea
Author_Institution :
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
Abstract :
The PCB inspection system presented in this paper can detect defects including the breaks in the wires and short circuit and is significantly faster when compared to the existing techniques. The proposed inspection method is based on referential matching between the stored reference image and the test (observed) image. Block matching is performed to solve the misalignment in referential matching. In order to reduce the computational complexity, we implement the proposed algorithm using the single instruction multiple data (SIMD) instructions, so called SSE2
Keywords :
automatic optical inspection; computational complexity; fault location; image matching; printed circuits; real-time systems; wires (electric); AOI; PCB inspection system; SSE2; automated optical inspection; block matching; computational complexity reduction; defects detection; printed circuit boards; real-time inspection system; referential matching; short circuit detection; single instruction multiple data instructions; stored reference image; test image; wire breaks detection; Circuit testing; Computational complexity; Computer errors; Design methodology; Humans; Image processing; Inspection; Printed circuits; Real time systems; Wires;
Conference_Titel :
Industrial Electronics, 2001. Proceedings. ISIE 2001. IEEE International Symposium on
Conference_Location :
Pusan
Print_ISBN :
0-7803-7090-2
DOI :
10.1109/ISIE.2001.931775
