Title :
Statistical analysis of nonlinear current-mode circuits
Author_Institution :
Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, Ont., Canada
Abstract :
This paper presents an efficient statistical analysis method for nonlinear current-mode circuits. The method is based on Volterra functional series representation of nonlinear systems and piecewise linear interpolation. The mean and variance of the response of nonlinear current-mode circuits with multiple nonlinear elements are computed at equi-distance points of time. The method presented in this paper has been implemented in a computer program. A second-generation current-mode memory cell is analyzed and the results are presented, together with those from Monte Carlo simulation
Keywords :
MOSFET; Monte Carlo methods; Volterra series; circuit analysis computing; current-mode circuits; interpolation; nonlinear network analysis; piecewise linear techniques; statistical analysis; CAD tools; CMOS fabrication process; MOS transistors; Monte Carlo simulation; Volterra functional series; computer program; mean; multiple nonlinear elements; nonlinear current-mode circuits; nonlinear systems; piecewise linear interpolation; second-generation current-mode memory cell; statistical analysis; variance; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS memory circuits; CMOS process; Current mode circuits; Dynamic voltage scaling; Nonlinear circuits; Piecewise linear techniques; Statistical analysis; Vectors;
Conference_Titel :
Electrical and Computer Engineering, 2001. Canadian Conference on
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-6715-4
DOI :
10.1109/CCECE.2001.933748
