Title :
Effective use of Boolean satisfiability procedures in the formal verification of superscalar and VLIW microprocessors
Author :
Velev, Miroslav N. ; Bryant, Randal E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
We compare SAT-checkers and decision diagrams on the evaluation of Boolean formulas produced in the formal verification of both correct and buggy versions of superscalar and VLIW microprocessors. We identify one SAT-checker that significantly outperforms the rest. We evaluate ways to enhance its performance by variations in the generation of the Boolean correctness formulas. We reassess optimizations previously used to speed up the formal verification and probe future challenges.
Keywords :
Boolean functions; binary decision diagrams; formal verification; microprocessor chips; parallel architectures; Boolean correctness formulas; Boolean satisfiability procedures; SAT-checkers; VLIW microprocessors; decision diagrams; formal verification; superscalar microprocessors; Automatic test pattern generation; Boolean functions; Circuits; Computer science; Data structures; Formal verification; Microprocessors; Permission; Probes; VLIW;
Conference_Titel :
Design Automation Conference, 2001. Proceedings
Print_ISBN :
1-58113-297-2
DOI :
10.1109/DAC.2001.156140