• DocumentCode
    1747941
  • Title

    Dynamic detection and removal of inactive clauses in SAT with application in image computation

  • Author

    Gupta, Arpan ; Gupta, Arpan ; Yang, Zengli ; Ashar, Pranav

  • Author_Institution
    CCRL, NEC Res. Inst., Princeton, NJ, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    536
  • Lastpage
    541
  • Abstract
    In this paper, we present a new technique for the efficient dynamic detection and removal of inactive clauses, i.e. clauses that do not affect the solutions of interest of a Boolean satisfiability (SAT) problem. The algorithm is based on the extraction of gate connectivity information during generation of the Boolean formula from the circuit, and its use in the inner loop of a branch-and-bound SAT algorithm. The motivation for this optimization is to exploit the circuit structure information, which can be used to find unobservable gates at circuit outputs under dynamic conditions. It has the potential to speed up all applications of SAT in which the SAT formula is derived from a logic circuit. In particular, we find that it has considerable impact on an image computation algorithm based on SAT. We present practical results for benchmark circuits which show that the use of this optimization consistently improves the performance for reachability analysis, in some cases enabling the prototype tool to reach more states than otherwise possible.
  • Keywords
    Boolean functions; VLSI; circuit CAD; computability; formal verification; logic CAD; logic gates; reachability analysis; tree searching; Boolean satisfiability problem; SAT; benchmark circuits; branch-and-bound SAT algorithm; circuit outputs; circuit structure information; dynamic detection; gate connectivity information; image computation algorithm; inactive clauses; logic circuit; reachability analysis; unobservable gates; Application software; Automatic test pattern generation; Computer applications; Decision making; Logic circuits; Logic gates; National electric code; Permission; Reachability analysis; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2001. Proceedings
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-297-2
  • Type

    conf

  • DOI
    10.1109/DAC.2001.156197
  • Filename
    935566