DocumentCode
1747960
Title
Statistical design space exploration for application-specific unit synthesis
Author
Bruni, Davide ; Bogliolo, Alessandro ; Benini, Luca
Author_Institution
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fYear
2001
fDate
2001
Firstpage
641
Lastpage
646
Abstract
The capability of performing semi-automated design space exploration is the main advantage of high-level synthesis with respect to RTL design. However, design space exploration performed during; high-level synthesis is limited in scope, since it provides promising solutions that represent good starting points for subsequent optimizations, but it provides no insight about the overall structure of the design space. In this work we propose unsupervised Monte-Carlo design exploration and statistical characterization to capture the key features of the design space. Our analysis provides insight on how various solutions are distributed over the entire design space. In addition, we apply extreme value theory (1997) to extrapolate achievable bounds from the sampling points.
Keywords
Monte Carlo methods; application specific integrated circuits; circuit optimisation; high level synthesis; integrated circuit design; RTL design; application-specific unit synthesis; design space exploration; extreme value theory; high-level synthesis; semi-automated design; statistical design; unsupervised Monte-Carlo design; Boosting; Constraint optimization; Cost function; Design optimization; Embedded software; Graphics; High level synthesis; Permission; Sampling methods; Space exploration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2001. Proceedings
ISSN
0738-100X
Print_ISBN
1-58113-297-2
Type
conf
DOI
10.1109/DAC.2001.156217
Filename
935586
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