• DocumentCode
    1747962
  • Title

    Functional correlation analysis in crosstalk induced critical paths identification

  • Author

    Xiao, T. ; Marek-Sadowska, M.

  • Author_Institution
    Sun Microsyst. Inc., Palo Alto, CA, USA
  • fYear
    2001
  • fDate
    22-22 June 2001
  • Firstpage
    653
  • Lastpage
    656
  • Abstract
    In deep submicron digital circuits capacitive couplings make delay of a switching signal highly dependent on its neighbors´ switching times and switching directions. A long path may have a large number of coupling neighbors with difficult to determine interdependencies. Ignoring the mutual relationship among the signals may result in a very pessimistic estimation of circuit delay. In this paper, we apply efficient functional correlation analysis techniques to identify critical paths caused by crosstalk delay effects. We also discuss applications to static timing optimization. Experiments demonstrate efficacy of the proposed technique.
  • Keywords
    VLSI; combinational circuits; correlation methods; crosstalk; delays; integrated circuit measurement; logic gates; timing; capacitive couplings; circuit delay; crosstalk delay effects; crosstalk induced critical paths identification; deep submicron digital circuits; functional correlation analysis; static timing optimization; switching directions; switching times; Cause effect analysis; Coupling circuits; Crosstalk; Delay effects; Delay estimation; Digital circuits; Switches; Switching circuits; Timing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2001. Proceedings
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-297-2
  • Type

    conf

  • DOI
    10.1109/DAC.2001.156219
  • Filename
    935588