DocumentCode
1747962
Title
Functional correlation analysis in crosstalk induced critical paths identification
Author
Xiao, T. ; Marek-Sadowska, M.
Author_Institution
Sun Microsyst. Inc., Palo Alto, CA, USA
fYear
2001
fDate
22-22 June 2001
Firstpage
653
Lastpage
656
Abstract
In deep submicron digital circuits capacitive couplings make delay of a switching signal highly dependent on its neighbors´ switching times and switching directions. A long path may have a large number of coupling neighbors with difficult to determine interdependencies. Ignoring the mutual relationship among the signals may result in a very pessimistic estimation of circuit delay. In this paper, we apply efficient functional correlation analysis techniques to identify critical paths caused by crosstalk delay effects. We also discuss applications to static timing optimization. Experiments demonstrate efficacy of the proposed technique.
Keywords
VLSI; combinational circuits; correlation methods; crosstalk; delays; integrated circuit measurement; logic gates; timing; capacitive couplings; circuit delay; crosstalk delay effects; crosstalk induced critical paths identification; deep submicron digital circuits; functional correlation analysis; static timing optimization; switching directions; switching times; Cause effect analysis; Coupling circuits; Crosstalk; Delay effects; Delay estimation; Digital circuits; Switches; Switching circuits; Timing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2001. Proceedings
Conference_Location
Las Vegas, NV, USA
ISSN
0738-100X
Print_ISBN
1-58113-297-2
Type
conf
DOI
10.1109/DAC.2001.156219
Filename
935588
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