Title :
Locating a Faulty Interaction in Pair-wise Testing
Author :
Nagamoto, Takahiro ; Kojima, H. ; Nakagawa, Hirotoshi ; Tsuchiya, Takao
Author_Institution :
Osaka Univ., Suita, Japan
Abstract :
This article discusses the location of faulty interactions in software testing. We propose an algorithm to generate a test suite that can be used to identify a faulty pair-wise interaction. This approach works as follows. First, a test suite is generated using an existing method for pair-wise testing. Pair-wise testing requires testing all pair-wise interactions but does not guarantee that the faulty interaction can be located. Second, pair-wise interactions that cannot be located by the test suite are enumerated. Finally, test cases are repeatedly added to the test suite until all pair-wise interactions can be located. The results of applying the algorithm to several problem instances show that the test suites obtained using the algorithm are nearly twice as large as those for ordinary pair-wise testing which does not ensure fault locating ability.
Keywords :
program testing; faulty interaction location ability; faulty pair-wise interaction identification; pair-wise testing; software testing; test suite enumeration; test suite generation; Arrays; Browsers; Educational institutions; Fault diagnosis; Protocols; Prototypes; Testing;
Conference_Titel :
Dependable Computing (PRDC), 2014 IEEE 20th Pacific Rim International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-6473-4
DOI :
10.1109/PRDC.2014.26