DocumentCode
1748656
Title
Real-time feature tracking and outlier rejection with changes in illumination
Author
Jin, Hailin ; Favaro, Paolo ; Soatto, Stefano
Author_Institution
Dept. of Electr. Eng., Washington Univ., St. Louis, MO, USA
Volume
1
fYear
2001
fDate
2001
Firstpage
684
Abstract
We develop an efficient algorithm to track point features supported by image patches undergoing affine deformations and changes in illumination. The algorithm is based on a combined model of geometry and photometry, that is used to track features as well as to detect outliers in a hypothesis testing framework. The algorithm runs in real time on a personal computer; and is available to the public
Keywords
computational geometry; computer vision; real-time systems; affine deformations; geometry; image patches; outlier rejection; photometry; point features; real-time feature tracking; Application software; Computer science; Layout; Lighting; Microcomputers; Photometry; Real time systems; Robustness; Target tracking; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision, 2001. ICCV 2001. Proceedings. Eighth IEEE International Conference on
Conference_Location
Vancouver, BC
Print_ISBN
0-7695-1143-0
Type
conf
DOI
10.1109/ICCV.2001.937588
Filename
937588
Link To Document