Minimization of technological losses in industrial production of low noise-factor wide-banded transistor amplifiers

A statistical mathematical model for predicting the noise characteristics of low noise-factor transistor amplifiers (LTA) in conditions of industrial production is offered. It enables to minimize technological losses in serial production at the stage of designing and also to determine the percentage of output of valid devices, substantiating the input and output standards of quality control, depth and accuracy of tuning at the level of matching on input of LTA. The presented mathematical model can be used as a part of system of automated designing of industrial LTA devices, with minimization of technological losses of production process based on the criteria of minimum of the noise-factor