DocumentCode
1749189
Title
Learning metrics for self-organizing maps
Author
Kaski, Samuel ; Sinkkonen, Janne ; Peltonen, Jaakko
Author_Institution
Neural Networks Res. Centre, Helsinki Univ. of Technol., Espoo, Finland
Volume
2
fYear
2001
fDate
2001
Firstpage
914
Abstract
We introduce methods that adapt the metric of the data space to reflect relevance, as indicated by a auxiliary data associated with the primary data samples. The derived metric is especially useful in descriptive data analysis by unsupervised methods such as the self-organizing maps. In this work we use the new metric to refine SOM-based analyses of the factors affecting the bankruptcy risk of companies
Keywords
business data processing; data analysis; probability; self-organising feature maps; unsupervised learning; bankruptcy risk analysis; descriptive data analysis; learning metrics; probability; self-organizing maps; unsupervised learning; Data analysis; Data visualization; Minimization methods; Neural networks; Random variables; Risk analysis; Robustness; Self organizing feature maps; Space technology; Unsupervised learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 2001. Proceedings. IJCNN '01. International Joint Conference on
Conference_Location
Washington, DC
ISSN
1098-7576
Print_ISBN
0-7803-7044-9
Type
conf
DOI
10.1109/IJCNN.2001.939481
Filename
939481
Link To Document