Title :
Learning metrics for self-organizing maps
Author :
Kaski, Samuel ; Sinkkonen, Janne ; Peltonen, Jaakko
Author_Institution :
Neural Networks Res. Centre, Helsinki Univ. of Technol., Espoo, Finland
Abstract :
We introduce methods that adapt the metric of the data space to reflect relevance, as indicated by a auxiliary data associated with the primary data samples. The derived metric is especially useful in descriptive data analysis by unsupervised methods such as the self-organizing maps. In this work we use the new metric to refine SOM-based analyses of the factors affecting the bankruptcy risk of companies
Keywords :
business data processing; data analysis; probability; self-organising feature maps; unsupervised learning; bankruptcy risk analysis; descriptive data analysis; learning metrics; probability; self-organizing maps; unsupervised learning; Data analysis; Data visualization; Minimization methods; Neural networks; Random variables; Risk analysis; Robustness; Self organizing feature maps; Space technology; Unsupervised learning;
Conference_Titel :
Neural Networks, 2001. Proceedings. IJCNN '01. International Joint Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7044-9
DOI :
10.1109/IJCNN.2001.939481