Title :
Emission site control in carbon nanotube field emitters by focused ion beam irradiation
Author :
Sawada, A. ; Iriguchi, M. ; Zhao, W.J. ; Ochiai, C. ; Takai, M.
Author_Institution :
Res. Center for Mater. Sci. at Extreme Conditions, Osaka Univ., Japan
Abstract :
Effect of ion irradiation on emission behavior in CNT (carbon nano tube) emitters has been investigated using focused ion beams (FIBs). The improvement in emission behavior with a drastic reduction in turn-on voltage and increase in emission current was found after FIB irradiation in CNT emitters
Keywords :
carbon nanotubes; electron field emission; focused ion beam technology; C; carbon nanotube field emitter; emission current; emission site control; focused ion beam irradiation; turn-on voltage; Aging; Aluminum; Anodes; Carbon dioxide; Carbon nanotubes; Cathodes; Electron emission; Glass; Ion beams; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location :
Davis, CA
Print_ISBN :
0-7803-7197-6
DOI :
10.1109/IVMC.2001.939637
