DocumentCode
1749293
Title
Emission site control in carbon nanotube field emitters by focused ion beam irradiation
Author
Sawada, A. ; Iriguchi, M. ; Zhao, W.J. ; Ochiai, C. ; Takai, M.
Author_Institution
Res. Center for Mater. Sci. at Extreme Conditions, Osaka Univ., Japan
fYear
2001
fDate
2001
Firstpage
29
Lastpage
30
Abstract
Effect of ion irradiation on emission behavior in CNT (carbon nano tube) emitters has been investigated using focused ion beams (FIBs). The improvement in emission behavior with a drastic reduction in turn-on voltage and increase in emission current was found after FIB irradiation in CNT emitters
Keywords
carbon nanotubes; electron field emission; focused ion beam technology; C; carbon nanotube field emitter; emission current; emission site control; focused ion beam irradiation; turn-on voltage; Aging; Aluminum; Anodes; Carbon dioxide; Carbon nanotubes; Cathodes; Electron emission; Glass; Ion beams; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location
Davis, CA
Print_ISBN
0-7803-7197-6
Type
conf
DOI
10.1109/IVMC.2001.939637
Filename
939637
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