DocumentCode
1749302
Title
Spindt tip aging: understanding the behavior of single tips and groups of tips
Author
Dean, Kenneth A. ; Lucero, Rudy ; Wiemann, Dave ; Markham, Janet L. ; Jaskie, James E.
Author_Institution
Motorola Inc., Tempe, AZ, USA
fYear
2001
fDate
2001
Firstpage
117
Lastpage
118
Abstract
The physical mechanisms responsible for emitter aging in field emission displays are difficult to elucidate from typical device lifetests. We examined the field emission physics of single Spindt tips in a special device structure. Our findings indicate that individual tips emit from multiple nano-scale features with fluctuating current levels. We developed a "burn-in" procedure and characterized several aging mechanisms
Keywords
ageing; current fluctuations; field emission displays; life testing; Spindt tip aging; burn-in method; current fluctuations; device life testing; field emission display; Aging; Anodes; Current measurement; Data acquisition; Flat panel displays; Performance evaluation; Plasma measurements; Prototypes; Pulse amplifiers; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location
Davis, CA
Print_ISBN
0-7803-7197-6
Type
conf
DOI
10.1109/IVMC.2001.939681
Filename
939681
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