Title :
Spindt tip aging: understanding the behavior of single tips and groups of tips
Author :
Dean, Kenneth A. ; Lucero, Rudy ; Wiemann, Dave ; Markham, Janet L. ; Jaskie, James E.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
Abstract :
The physical mechanisms responsible for emitter aging in field emission displays are difficult to elucidate from typical device lifetests. We examined the field emission physics of single Spindt tips in a special device structure. Our findings indicate that individual tips emit from multiple nano-scale features with fluctuating current levels. We developed a "burn-in" procedure and characterized several aging mechanisms
Keywords :
ageing; current fluctuations; field emission displays; life testing; Spindt tip aging; burn-in method; current fluctuations; device life testing; field emission display; Aging; Anodes; Current measurement; Data acquisition; Flat panel displays; Performance evaluation; Plasma measurements; Prototypes; Pulse amplifiers; Zinc oxide;
Conference_Titel :
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location :
Davis, CA
Print_ISBN :
0-7803-7197-6
DOI :
10.1109/IVMC.2001.939681
