Title :
Applications to photoconductor-ferroelectric memory of PZT thin films
Author :
Adachi, M. ; Wang, W. ; Karaki, T.
Author_Institution :
Dept. of Electron. & Informatics, Toyama Prefectural Univ., Japan
Abstract :
Zr-rich PZT films have been successfully grown on both PLT/Pt/Ti/SiO2/Si and Ir/SiO2/Si substrates by RF magnetron sputtering using multi metal targets. A photoconductor-ferroelectric memory (PFM) is proposed in this paper. The basic principle of the PFM is to form a two layers integration structure of ferroelectric film and a-Si:H film. This PFM device with the structure of ITO/a-Si:H/PZT/Ir/SiO2/Si has been prepared by the RF magnetron sputtering method. The photoconductive effect of a-Si:H under the focused laser beam is used for addressing. The remanent polarization directions of the PZT ferroelectric layer are used for "1" or "0" states of memory. The pyroelectric current directions are used for read-out. The hysteresis loop of the single cell was observed and the pyroelectric current and its direction was read-out by lamp illumination. Thus, the write and readout characteristics of the PFM have been demonstrated
Keywords :
dielectric hysteresis; ferroelectric storage; ferroelectric thin films; lead compounds; photoconducting devices; pyroelectric devices; sputtered coatings; ITO-Si:H-PZT-Ir-SiO2-Si; ITO/a-Si:H/PZT/Ir/SiO2/Si structure; InSnO-Si:H-PbZrO3TiO3-Ir-SiO2-Si; Ir/SiO2/Si substrate; PLT/Pt/Ti/SiO2/Si substrate; PZT ferroelectric thin film; RF magnetron sputtering; a-Si:H film; focused laser beam; hysteresis loop; photoconductive effect; photoconductor-ferroelectric memory; pyroelectric current; remanent polarization; Ferroelectric films; Indium tin oxide; Laser beams; Magnetic devices; Photoconductivity; Pyroelectricity; Radio frequency; Semiconductor films; Sputtering; Substrates;
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-5940-2
DOI :
10.1109/ISAF.2000.941514