Title :
Power quality monitoring as integrated with distribution automation
Author :
Mäkinen, Antti ; Parkki, Marko ; Järventausta, Pertti ; Kortesluoma, Markus ; Verho, Pekka ; Vehviläinen, Seppo ; Seesvuori, Reino ; Rinta-Opas, Aimo
Author_Institution :
Tampere Univ. of Technol., Finland
Abstract :
At Tampere University of Technology, Finland, there is an on-going project on power quality data management. One target of the project is to define power quality monitoring functions as a part of integrated distribution automation. Distribution automation opens new possibilities for continuous power quality monitoring. For example, modern protection relays and monitoring units or intelligent kWh-meters include new functions to monitor power quality both at primary substation and secondary substation levels. The advanced computer systems of the control center with the open architecture makes it possible to integrate the power quality data with the normal network operation and planning processes. When some abnormal quantities are identified by continuous on-line monitoring, more detailed measurements with advanced measurement equipment can be done at specific network points or at customer facilities
Keywords :
computerised monitoring; open systems; power distribution control; power supply quality; power system measurement; Finland; Tampere University of Technology; abnormal quantities identification; advanced measurement equipment; continuous on-line monitoring; continuous power quality monitoring; control center computer systems; distribution automation integration; integrated distribution automation; intelligent kWh-meters; monitoring units; normal network operation; open architecture; planning processes; power quality data integration; power quality data management; power quality monitoring; power quality monitoring functions; primary substation; protection relays; secondary substation;
Conference_Titel :
Electricity Distribution, 2001. Part 1: Contributions. CIRED. 16th International Conference and Exhibition on (IEE Conf. Publ No. 482)
Conference_Location :
Amsterdam
Print_ISBN :
0-85296-735-7
DOI :
10.1049/cp:20010783