Title :
A 2.3 pJ/bit frequency-stable impulse OOK transmitter powered directly by an RF energy harvesting circuit with −19.5 dBm sensitivity
Author :
Ito, H. ; Masui, Shoichi ; Momiyama, Youichi ; Shirane, A. ; Takayasu, Makoto ; Yoneda, Yoshihiro ; Ibe, Taiki ; Hamada, Takahiro ; Ikeda, Shoji ; Yamane, Daisuke ; Ishihara, Noboru ; Masu, Kazuya
Author_Institution :
Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
The proposed 2.5-GHz-band impulse transmitter technology realizes frequency-stable impulse generation against PVT variation and superior energy-per-bit operation, and it can be powered directly from a - 19.5-dBm-sensitivity RF energy harvesting circuit without any regulators that are generally essential to power RF circuits. The transmitter occupies 0.38 mm2 in a 65nm CMOS technology. The maximum frequency difference among measured output return-loss peak of 9 chips with 3 different process corners under 0.5 V supply is about 50 MHz without any frequency calibration. Our prototype achieves 1 Mb/s signal transmission under 2.3 μW power consumption from 0.5 V supply thanks to pulse-level duty cycling operation of maximally digital architecture.
Keywords :
CMOS integrated circuits; UHF devices; UHF integrated circuits; amplitude shift keying; energy harvesting; radio transmitters; ultra wideband communication; CMOS technology; PVT variation; RF energy harvesting circuit; bit rate 1 Mbit/s; frequency 2.5 GHz; frequency calibration; frequency-stable impulse OOK transmitter; frequency-stable impulse generation; impulse transmitter technology; maximum frequency difference; output return-loss peak measurement; power 2.3 muW; power RF circuit; pulse-level duty cycling operation; size 65 nm; superior energy-per-bit operation; voltage 0.5 V; Clocks; Frequency measurement; Power demand; Power measurement; Radio frequency; Voltage measurement; Impulse ultra-wideband radio; RF energy harvesting; Ultra low power RF;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium, 2014 IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
978-1-4799-3862-9
DOI :
10.1109/RFIC.2014.6851645
