A full wave analysis of metal strip on thin film semiconductor and its interaction with surface acoustic wave using moment method technique

Author

Elkordy, R. ; Taha, T.E. ; Gomaa, A.

Author_Institution

Fac. of Electron. Eng., Menoufia Univ., Egypt

Volume

1

fYear

2001

fDate

2001

Firstpage

308

Abstract

The moment method technique is formulated to carry out a full wave analysis of a periodic metal strip on thin film semiconductor. A number of basis and testing functions which verify the boundary conditions of electric field are assumed for the solution. The solution gives electric field distribution as well as potential and charge distribution. The surface impedance can be calculated using the relation of potential and charge density. The impedance calculations lead to application in transmission line structure as well as interaction with surface acoustic wave. The influence of surface impedance on the propagation characteristics of surface acoustic waves is presented. A small number of basis functions which reduce computational time give good results. Our results agree very well with data of Green´s function

Keywords

Green´s function methods; MMIC; acoustic microwave devices; method of moments; microstrip circuits; microstrip lines; periodic structures; surface acoustic wave correlation; surface acoustic wave devices; Green´s function; boundary conditions; charge density; charge distribution; electric field distribution; full wave analysis; impedance calculations; metal strip; microstrip line; moment method technique; monolithic microwave integrated circuits; periodic structure; surface acoustic wave; surface impedance; thin film semiconductor; transmission line structure; Acoustic waves; Boundary conditions; Moment methods; Potential well; Semiconductor thin films; Strips; Surface acoustic waves; Surface impedance; Testing; Transmission lines;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Engineering of Millimeter and Sub-Millimeter Waves, 2001. The Fourth International Kharkov Symposium on

Conference_Location

Kharkov

Print_ISBN

0-7803-6473-2

Type

conf

DOI

10.1109/MSMW.2001.946835

Filename

946835