DocumentCode :
1751942
Title :
Design for test using a multi-tiered, model based specification approach
Author :
Bukata, Eric
Author_Institution :
Titan Syst. Corp., USA
fYear :
2001
fDate :
2001
Firstpage :
206
Lastpage :
213
Abstract :
A complex electronic system may consist of numerous components and subcomponents. Each of the components, as well as the system as a whole, may be specified for design, test, and diagnostic purposes. These specifications, in turn, may be captured using model based techniques. Currently, such models are not generally used in conjunction with each other to the extent that they can provide benefits with regard to test and diagnostic validation and verification across the system. This paper attempts to demonstrate how model based specifications for test and diagnostics can be integrated and used within the design process to provide design for test capabilities
Keywords :
automatic testing; design for testability; electronic design automation; fault diagnosis; formal verification; AI-ESTATE; DFT; Rosetta; complex electronic system; design for test capabilities; diagnostic validation; multi-tiered model based specification approach; system level specifications; test requirements model; test validation; verification; Appropriate technology; Design for testability; Electronic equipment testing; Fault detection; Hardware; Intellectual property; Process design; Protection; Silicon; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
ISSN :
1080-7225
Print_ISBN :
0-7803-7094-5
Type :
conf
DOI :
10.1109/AUTEST.2001.948965
Filename :
948965
Link To Document :
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