DocumentCode
1751942
Title
Design for test using a multi-tiered, model based specification approach
Author
Bukata, Eric
Author_Institution
Titan Syst. Corp., USA
fYear
2001
fDate
2001
Firstpage
206
Lastpage
213
Abstract
A complex electronic system may consist of numerous components and subcomponents. Each of the components, as well as the system as a whole, may be specified for design, test, and diagnostic purposes. These specifications, in turn, may be captured using model based techniques. Currently, such models are not generally used in conjunction with each other to the extent that they can provide benefits with regard to test and diagnostic validation and verification across the system. This paper attempts to demonstrate how model based specifications for test and diagnostics can be integrated and used within the design process to provide design for test capabilities
Keywords
automatic testing; design for testability; electronic design automation; fault diagnosis; formal verification; AI-ESTATE; DFT; Rosetta; complex electronic system; design for test capabilities; diagnostic validation; multi-tiered model based specification approach; system level specifications; test requirements model; test validation; verification; Appropriate technology; Design for testability; Electronic equipment testing; Fault detection; Hardware; Intellectual property; Process design; Protection; Silicon; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location
Valley Forge, PA
ISSN
1080-7225
Print_ISBN
0-7803-7094-5
Type
conf
DOI
10.1109/AUTEST.2001.948965
Filename
948965
Link To Document