• DocumentCode
    1751942
  • Title

    Design for test using a multi-tiered, model based specification approach

  • Author

    Bukata, Eric

  • Author_Institution
    Titan Syst. Corp., USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    206
  • Lastpage
    213
  • Abstract
    A complex electronic system may consist of numerous components and subcomponents. Each of the components, as well as the system as a whole, may be specified for design, test, and diagnostic purposes. These specifications, in turn, may be captured using model based techniques. Currently, such models are not generally used in conjunction with each other to the extent that they can provide benefits with regard to test and diagnostic validation and verification across the system. This paper attempts to demonstrate how model based specifications for test and diagnostics can be integrated and used within the design process to provide design for test capabilities
  • Keywords
    automatic testing; design for testability; electronic design automation; fault diagnosis; formal verification; AI-ESTATE; DFT; Rosetta; complex electronic system; design for test capabilities; diagnostic validation; multi-tiered model based specification approach; system level specifications; test requirements model; test validation; verification; Appropriate technology; Design for testability; Electronic equipment testing; Fault detection; Hardware; Intellectual property; Process design; Protection; Silicon; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
  • Conference_Location
    Valley Forge, PA
  • ISSN
    1080-7225
  • Print_ISBN
    0-7803-7094-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.2001.948965
  • Filename
    948965