Multi-anode sawtooth SDD for X-ray spectroscopy fabricated on NTD wafers

We are developing a multi-anode sawtooth Si drift detector (MSSDD) with an anode pitch of 250 μm for one-dimensional position sensitive detection of low energy X-rays down to ~200 eV. The detector is intended to be used in X-ray diffraction analysis. In this paper we present new results of X-ray spectroscopy measurements with detectors fabricated on neutron transmutation doped (NTD) wafers with a thickness of 290 μm. Using an MSSDD with an anode pitch of 250 μm and having p⁺ strips on both sides, we have measured an energy resolution of 191 eV FWHM per anode pixel for the 5.89 keV line of ⁵⁵Fe at 213 K. At room temperature the energy resolution is 375 eV FWHM. Split events are almost completely eliminated due to the sawtooth shaped p⁺ strips