DocumentCode :
1751969
Title :
Production and testing of the DØ silicon microstrip tracker
Author :
DO Collaboration
Author_Institution :
Fermilab, Batavia, IL
Volume :
1
fYear :
2000
fDate :
2000
Abstract :
The DØ collaboration is completing production of a 793,000 channel-silicon strip tracking system for the DØ upgrade. The tracker consists of 768 ladder and wedge assemblies including both single and double sided detectors. The production process includes burn-in of electronics, mechanical assembly under coordinate measuring machines, wirebonding, repair of bad channels, detector burn-in, laser testing, and final assembly. We describe observed failure modes of the detectors, including microdischarge and lithography defects. We present results of the production and testing process, and describe the anticipated, performance of the detector. Lessons for future production of large scale tracking systems are discussed
Keywords :
failure analysis; lead bonding; nuclear electronics; position sensitive particle detectors; silicon radiation detectors; Ø; D0 silicon microstrip tracker; Si; coordinate measuring machines; detector burn-in; double sided detectors; failure modes; large scale tracking systems; laser testing; lithography defects; mechanical assembly; microdischarge; silicon strip tracking system; single sided detectors; wirebonding; Assembly; Collaboration; Coordinate measuring machines; Detectors; Electronic equipment testing; Laser modes; Microstrip; Production systems; Silicon; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949017
Filename :
949017
Link To Document :
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