Performance of irradiated and non-irradiated 500 μm thick-silicon microstrip detectors

Author

Lenzi, M. ; Borrello, L. ; Buffini, A. ; Busoni, S. ; Civinini, C. ; Alessandro, R.D. ; Orso, R. Dell ; Dutta, S. ; Meschini, M. ; Messineo, A. ; Segneri, G. ; Starodumov, A. ; Tonelli, G. ; Verdini, P.G.

Author_Institution

Florence Univ., Italy

Volume

1

fYear

2000

fDate

2000

Abstract

The decision-taken by the CMS experiment to build a tracker entirely based on silicon detectors has made necessary the use of thicker sensors instead of the usual 300 μm ones for the outer part of the detector. We present first results on the performance of 500 μm thick detectors, before and after neutron irradiation, bonded to the CMS tracker front-end electronics. Laboratory measurements show that the total collected charge scales linearly with thickness when compared with a 300 μm module and the measured noise is in good agreement with expectations. The results obtained confirm the feasibility of large area silicon trackers

Keywords

neutron effects; semiconductor device noise; silicon radiation detectors; CMS experiment; Si; Si microstrip detectors; large area Si trackers; neutron irradiation; noise; Bonding; Charge measurement; Collision mitigation; Current measurement; Detectors; Laboratories; Neutrons; Noise measurement; Silicon; Thickness measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2000 IEEE

Conference_Location

Lyon

ISSN

1082-3654

Print_ISBN

0-7803-6503-8

Type

conf

DOI

10.1109/NSSMIC.2000.949033

Filename

949033