DocumentCode :
1751981
Title :
Performance of irradiated and non-irradiated 500 μm thick-silicon microstrip detectors
Author :
Lenzi, M. ; Borrello, L. ; Buffini, A. ; Busoni, S. ; Civinini, C. ; Alessandro, R.D. ; Orso, R. Dell ; Dutta, S. ; Meschini, M. ; Messineo, A. ; Segneri, G. ; Starodumov, A. ; Tonelli, G. ; Verdini, P.G.
Author_Institution :
Florence Univ., Italy
Volume :
1
fYear :
2000
fDate :
2000
Abstract :
The decision-taken by the CMS experiment to build a tracker entirely based on silicon detectors has made necessary the use of thicker sensors instead of the usual 300 μm ones for the outer part of the detector. We present first results on the performance of 500 μm thick detectors, before and after neutron irradiation, bonded to the CMS tracker front-end electronics. Laboratory measurements show that the total collected charge scales linearly with thickness when compared with a 300 μm module and the measured noise is in good agreement with expectations. The results obtained confirm the feasibility of large area silicon trackers
Keywords :
neutron effects; semiconductor device noise; silicon radiation detectors; CMS experiment; Si; Si microstrip detectors; large area Si trackers; neutron irradiation; noise; Bonding; Charge measurement; Collision mitigation; Current measurement; Detectors; Laboratories; Neutrons; Noise measurement; Silicon; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949033
Filename :
949033
Link To Document :
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