• DocumentCode
    1751984
  • Title

    Characterization of thin back-to-back CdTe detectors with various sizes

  • Author

    Auricchio, Natalia ; Caroli, Ezio ; Donati, Ariano ; Dusi, Waldes ; Fougeres, Paul ; Grassi, Donato ; Perillo, Eugenio ; Siffert, Paul

  • Author_Institution
    Istituto TESRE, CNR, Bologna, Italy
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    42473
  • Abstract
    Thin CdTe detectors (3 mm×5 mm electrode area, 0.5 and 0.8 mm thick), mounted in back-to-back configuration with common anode, have been characterized. This configuration allows one to double the useful absorbing thickness in the classical planar parallel field (PPF) irradiation geometry, and to double the sensitive areas in the planar transverse field (PTF) geometry, while maintaining the same inter-electrode distances (0.5 or 0.8 mm) and one electronic chain, as for single detectors. The tests performed aim at understanding the effects on the spectroscopic performance of various interelectrode distances and in particular of the chemical and mechanical treatments used to reduce the detector thickness to the desired values
  • Keywords
    X-ray detection; X-ray spectrometers; gamma-ray detection; gamma-ray spectrometers; semiconductor counters; 0.1 mm; 0.5 mm; 0.8 mm; 1 mm; 10 to 150 keV; 20 mm; 3 mm; 5 mm; CdTe; X-ray detector; classical planar parallel field irradiation geometry; common anode; gamma-ray detector; planar transverse field; spectroscopic performance; thin back-to-back CdTe detectors; Anodes; Detectors; Electrodes; Extraterrestrial measurements; Face detection; Geometry; Performance evaluation; Sensor arrays; Spectroscopy; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2000 IEEE
  • Conference_Location
    Lyon
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-6503-8
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2000.949039
  • Filename
    949039