DocumentCode
1751984
Title
Characterization of thin back-to-back CdTe detectors with various sizes
Author
Auricchio, Natalia ; Caroli, Ezio ; Donati, Ariano ; Dusi, Waldes ; Fougeres, Paul ; Grassi, Donato ; Perillo, Eugenio ; Siffert, Paul
Author_Institution
Istituto TESRE, CNR, Bologna, Italy
Volume
1
fYear
2000
fDate
2000
Firstpage
42473
Abstract
Thin CdTe detectors (3 mm×5 mm electrode area, 0.5 and 0.8 mm thick), mounted in back-to-back configuration with common anode, have been characterized. This configuration allows one to double the useful absorbing thickness in the classical planar parallel field (PPF) irradiation geometry, and to double the sensitive areas in the planar transverse field (PTF) geometry, while maintaining the same inter-electrode distances (0.5 or 0.8 mm) and one electronic chain, as for single detectors. The tests performed aim at understanding the effects on the spectroscopic performance of various interelectrode distances and in particular of the chemical and mechanical treatments used to reduce the detector thickness to the desired values
Keywords
X-ray detection; X-ray spectrometers; gamma-ray detection; gamma-ray spectrometers; semiconductor counters; 0.1 mm; 0.5 mm; 0.8 mm; 1 mm; 10 to 150 keV; 20 mm; 3 mm; 5 mm; CdTe; X-ray detector; classical planar parallel field irradiation geometry; common anode; gamma-ray detector; planar transverse field; spectroscopic performance; thin back-to-back CdTe detectors; Anodes; Detectors; Electrodes; Extraterrestrial measurements; Face detection; Geometry; Performance evaluation; Sensor arrays; Spectroscopy; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949039
Filename
949039
Link To Document