DocumentCode :
1751993
Title :
Thin CVD diamond detectors with high charge collection efficiency
Author :
Brambilla, A. ; Tromson, D. ; Bergonzo, P. ; Mer, C. ; Foulon, F.
Author_Institution :
Lab d´´Electron. et de Technol. de l´´Inf., CEA, Centre d´´Etudes Nucleaires de Grenoble, France
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
24929
Abstract :
We report the measurements of charge collection efficiency for nuclear particle detectors made from electronic grade CVD diamond samples with thicknesses of 20 μm and 150 μm elaborated at CEA/LETI. Although it is well established that the transport properties of CVD diamond, and more specifically the μτ product, tends to improve with the sample thickness, it was observed that excellent collection efficiencies can be achieved on the 20 μm thick detector owing to the reduced inter electrode distance. Due to the polycrystalline nature of CVD diamond, the charge collection efficiency is inhomogeneous throughout the detector surface. However, a mean collection efficiency of 50% was measured over the hole detector surface, with regions close to 100%, corresponding to the highest values reported in literature for CVD diamond. This excellent performance enables the detection of very low energy heavy charged particles with a detection limit well below 200 keV for protons
Keywords :
diamond; proton detection; semiconductor counters; 150 micron; 20 micron; 200 keV; C; CVD diamond detectors; charge collection efficiency; muon tau product; Charge measurement; Chemical vapor deposition; Current measurement; Nuclear measurements; Particle measurements; Plasma measurements; Plasma temperature; Protons; Radiation detectors; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949050
Filename :
949050
Link To Document :
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