DocumentCode
1751998
Title
Simulation of the collection properties of CdTe strip detectors
Author
Cola, A. ; Quaranta, F. ; Caroli, E. ; Dusi, W. ; Perillo, E.
Author_Institution
IME, CNR, Lecce, Italy
Volume
1
fYear
2000
fDate
2000
Firstpage
35521
Abstract
CdTe is an attractive material for X and gamma-ray detectors but the poor transport properties of holes affect the performance by introducing a low energy tailing in the observed spectra. A possible solution to this problem is to optimize the electrode geometry, for example by reducing the dimension of the anode with respect to the cathode. In this way the charge signal in the external circuit is mostly-due to the electrons moving towards the anode that is where the weighing field becomes localized. The optimization of the electrode geometry requires a numerical analysis as the problem is complicated by stochastic trapping and detrapping processes, which are difficult to be treated analytically. In this work we present a numerical simulator based on a finite difference numerical method (which follows the weighing field approach) and on a Monte-Carlo procedure which is able to analyze, in two dimensions, the effect of different electrode configurations: single strip, multiple strip, a single strip with a lateral extended cathode and, for comparison, the uniform geometry. The results are analyzed in terms of the maps of the local charge collection efficiency and their histograms, equivalent to the spectra due to high energy X-rays
Keywords
Monte Carlo methods; X-ray astronomy; finite difference methods; semiconductor counters; CdTe strip detectors; Monte-Carlo; X-ray astronomy; collection properties; electrode geometry; finite difference; high energy X-rays; lateral extended cathode; multiple strip; numerical analysis; single strip; stochastic detrapping; stochastic trapping; weighing field; Anodes; Cathodes; Circuits; Electrodes; Electrons; Gamma ray detectors; Geometry; Numerical analysis; Stochastic processes; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949055
Filename
949055
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