Title :
Large volume thallium bromide detectors for gamma-ray spectroscopy
Author :
Hitomi, K. ; MUroi, M. ; Matsumoto, M. ; Shoji, T. ; Hiratate, Y.
Author_Institution :
Dept. of Electron., Tohoku Inst. of Technol., Sendai, Japan
Abstract :
Thallium bromide (TlBr) is a wide bandgap compound semiconductor characterized with high photon stopping power. In this study large volume γ-ray detectors (approximately 3.8·3.8·3.8 mm 3) have been fabricated from the TlBr crystals grown by the horizontal travelling molten zone (TRIZ) method using zone-purified material. In order to extract the energy information of the incident radiation from the thick detectors the short charge collection time technique has been applied to the detectors. By this technique, the induced charge on the electrode is measured for the period of time short compared to the carrier transit time in order to minimize the deviation of the measured induced charge. The large volume TlBr detectors irradiated with 22Na and 137Cs isotopic sources at room temperature have exhibited good energy resolutions of 18.7% and 17.4% (FWHM) for the 511 and 662 keV peaks, respectively. To our knowledge, it is the first achievement that full-energy peaks with good energy resolutions have been obtained from TlBr detectors several mm thick. Time stability of the detector operation has been studied as well. Detailed discussions of the device operation are given
Keywords :
crystal growth from melt; gamma-ray detection; gamma-ray spectrometers; semiconductor counters; thallium compounds; wide band gap semiconductors; zone melting; 137Cs isotopic sources; 22Na isotopic source; TlBr; carrier transit time; high photon stopping power; horizontal travelling molten zone method; large volume TlBr detectors; short charge collection time technique; wide bandgap compound semiconductor; zone-purified material; Charge measurement; Current measurement; Energy resolution; Gamma ray detection; Gamma ray detectors; Photonic band gap; Photonic crystals; Radiation detectors; Spectroscopy; Time measurement;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949062