DocumentCode
1752050
Title
Experimental and computational studies of the ultra-fast scintillators ZnO:Ga and CdS:In
Author
Derenzo, S.E. ; Klintenberg, M.K. ; Moses, W.W. ; Weber, M.J. ; Berdah, P.H. ; Perry, D.L.
Author_Institution
Lawrence Berkeley Nat. Lab., CA, USA
Volume
1
fYear
2000
fDate
2000
Abstract
We present experimental measurements and computational simulations of the ultra-fast scintillation mechanism that occurs in ZnO:Ga and CdS:In. These materials have measured rise times of <30 ps and exponential decay times of 660 and 190 ps, respectively, at room temperature. These scintillators are partially quenched at room temperature and have high luminous efficiencies at reduced temperatures. The scintillators are prepared by mixing 0.1 to 1 mol.% of the Ga2 O3 or In2O3 into the melt and then reducing with H2 or metal vapor. This process introduces an impurity band of donor electron states that overlaps the conduction band and is similar to n-doping in degenerate semiconductors. When a hole is created by ionizing radiation, one of the many donor band electrons can recombine with the hole in an allowed electric dipole transition to produce the scintillation light. [In many other scintillators, ionization electrons and holes form individual excitons whose radiative recombination is slow (spin-flip forbidden)]. We present band structure and molecular orbital cluster calculations supporting this picture of the scintillation process as well as providing guidance for the discovery of other scintillators for gamma ray and neutron detection that are both luminous and ultra-fast
Keywords
II-VI semiconductors; cadmium compounds; gallium; indium; scintillation; time resolved spectra; zinc compounds; 190 ps; 30 ps; 660 ps; CdS:In; ZnO:Ga; conduction band; donor electron states; exponential decay times; high luminous efficiencies; impurity band; molecular orbital cluster calculations; reduced temperatures; rise times; ultra-fast scintillators; Charge carrier processes; Computational modeling; Electrons; Extraterrestrial measurements; Ionization; Ionizing radiation; Radiative recombination; Semiconductor impurities; Spontaneous emission; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949113
Filename
949113
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