DocumentCode :
1752127
Title :
Comparative study of avalanche photodiodes with different structures in scintillation detection
Author :
Moszyriskia, M. ; Kapusta, M. ; Balcerzyk, M. ; Szawlowski, M. ; Wolski, D. ; Wegrzecka, I. ; Wegrzecki, M.
Author_Institution :
Soltan Inst. for Nucl. Studies, Swierk, Poland
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
42567
Abstract :
The performance of beveled-edge large area avalanche photodiodes (LAAPD) produced by Advanced Photonix, Inc. (API), Hamamatsu SPL 2560 APDs and APDs from Institute of Electron Technology (ITE) were studied in scintillation detection using CsI(Tl), BGO, LSO and YAP scintillators. Measurements covered DC gain characteristics, relative response to X-rays and light, energy resolution for 5.9 keV X-rays from 55Fe source, determination of electron-hole (e-h) pair number for the studied scintillators and their energy resolution for 662 keV γ-rays from a 137Cs source. The highest number of e-h pairs was measured with the LAAPD from API equal to 33800 e-h/MeV for CsI(Tl) and 10200 e-h/MeV for YAP crystal. In the case of the Hamamatsu APD, the respective numbers were 30900 e-h/MeV and 4700 e-h/MeV. For the APD from ITE we measured 16500 e-h/MeV with CsI(Tl). The best energy resolution of 4.9% for 662 keV was observed with CsI(Tl) coupled to LAAPD from API, while the Hamamatsu APD showed somewhat worse result of 5.8%
Keywords :
X-ray detection; amplification; avalanche photodiodes; solid scintillation detectors; 5.9 keV; 662 keV; 137Cs source; BGO; Bi4Ge3O12; CsI(Tl); CsI:Tl; DC gain; Hamamatsu SPL 2560; LSO; Lu2SiO4O:Ce; X-ray; YAP; avalanche photodiodes; electron-hole pair number; energy resolution; large area avalanche photodiodes; Avalanche photodiodes; Collision mitigation; Electrons; Energy resolution; Epitaxial layers; IEEE members; Photonics; Radiation detectors; Silicon; Solid scintillation detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949258
Filename :
949258
Link To Document :
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