Title :
A miniaturized solid state detection system for X-ray spectrometry based on Compton scattering
Author :
Baldazzi, G. ; Bernardi, T. ; Bersaglia, G. ; Ferrari, P. ; Rossi, P.L. ; Testoni, G. ; Zannoli, R.
Author_Institution :
Dipartimento di Fisica, Bologna Univ., Italy
Abstract :
In this paper a technical solution to the problem of performing spectral analysis of roentgendiagnostic X-ray beams-and its constraints-will be described. With this method, X-ray spectra are reconstructed starting from the beam scattered, by a suitable target, inside a miniaturized Compton Selection Chamber. Experimental results will be shown and compared with the spectra acquired in a more direct (but not practical for on-field measurements) way
Keywords :
X-ray spectrometers; silicon radiation detectors; Compton Selection Chamber; Compton scattering; Si; Si detector; X-ray spectra; X-ray spectrometry; Electromagnetic scattering; Image reconstruction; Particle scattering; Silicon; Solid state circuits; Spectroscopy; Testing; X-ray detection; X-ray detectors; X-ray scattering;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949305
