DocumentCode
1752145
Title
A miniaturized solid state detection system for X-ray spectrometry based on Compton scattering
Author
Baldazzi, G. ; Bernardi, T. ; Bersaglia, G. ; Ferrari, P. ; Rossi, P.L. ; Testoni, G. ; Zannoli, R.
Author_Institution
Dipartimento di Fisica, Bologna Univ., Italy
Volume
1
fYear
2000
fDate
2000
Firstpage
42598
Abstract
In this paper a technical solution to the problem of performing spectral analysis of roentgendiagnostic X-ray beams-and its constraints-will be described. With this method, X-ray spectra are reconstructed starting from the beam scattered, by a suitable target, inside a miniaturized Compton Selection Chamber. Experimental results will be shown and compared with the spectra acquired in a more direct (but not practical for on-field measurements) way
Keywords
X-ray spectrometers; silicon radiation detectors; Compton Selection Chamber; Compton scattering; Si; Si detector; X-ray spectra; X-ray spectrometry; Electromagnetic scattering; Image reconstruction; Particle scattering; Silicon; Solid state circuits; Spectroscopy; Testing; X-ray detection; X-ray detectors; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949305
Filename
949305
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