DocumentCode :
1752318
Title :
Experimental behaviour of a two-chip charge amplifier for high stability X-ray spectroscopy systems
Author :
Sampietro, M. ; Cruciata, H. ; Guazzoni, C. ; Lechner, P.
Author_Institution :
Politecnico di Milano, Italy
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
23621
Abstract :
We present the first experimental characterization of an innovative two-chips detector system for X-ray spectroscopy experiments in which stability of operation is mandatory to avoid on-line calibration procedures. The system is based on a silicon drift detector and on a charge amplifier, partly integrated in the detector chip. The design guidelines of both the “detector chip” produced on a high resistivity substrate and the “amplifier chip” designed in 0.8 μm BiCMOS technology are reviewed. The proper functionality of each of the two chips and the performance of the whole system have been experimentally verified
Keywords :
BiCMOS digital integrated circuits; X-ray spectroscopy; amplifiers; nuclear electronics; 0.8 micron; BiCMOS; Si; Si drift detector; X-ray spectroscopy; amplifier chip; detector chip; two-chip charge amplifier; Anodes; BiCMOS integrated circuits; Conductivity; Detectors; Face detection; Feedback; MOSFETs; Silicon; Spectroscopy; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949872
Filename :
949872
Link To Document :
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