Title :
PETRIC. A positron emission tomography readout integrated circuit
Author :
Pedrali-Noy, M. ; Gruber, G.J. ; Krieger, B. ; Mandelli, E. ; Meddeler, G. ; Moses, W.W. ; Rosso, V.
Author_Institution :
California Univ., Berkeley, CA, USA
Abstract :
We present architecture, critical design issues and performance measurements of PETRIC, a 64-channel mixed signal front-end integrated circuit (IC) for reading out photodiode (PD) array coupled with LSO scintillator crystals for a medical imaging application (PET). Each channel consists of a low noise charge sensitive pre-amplifier (CSA), an RC-CR pulse shaper and a winner-take-all (WTA) multiplexer that selects the channel with the largest input signal. Triggered by an external timing signal, a switch opens and a capacitor stores the peak voltage of the winner channel. The shaper rise and fall times are adjustable by means of external current inputs over a continuous range of 0.5 μs to 10 μs. Power consumption is 5.4 mW per channel, measured equivalent noise charge (ENC) at 1 μs peaking time, zero leakage current is 33 rms electrons plus 7.3 rms electrons per pF of input capacitance. Design is fabricated in 0.5 μm 3.3 V CMOS technology
Keywords :
CMOS integrated circuits; biomedical electronics; mixed analogue-digital integrated circuits; positron emission tomography; preamplifiers; pulse shaping circuits; readout electronics; 0.5 micron; 0.5 to 10 mus; 3.3 V; 5.4 mW; CMOS technology; PETRIC; RC-CR pulse shaper; charge sensitive pre-amplifier; equivalent noise charge; external current inputs; external timing signal; medical imaging application; mixed signal front-end integrated circuit; peak voltage; photodiode array; positron emission tomography; power consumption; readout integrated circuit; winner-take-all multiplexer; zero leakage current; Application specific integrated circuits; CMOS technology; Coupling circuits; Crystals; Electrons; Measurement; Photodiodes; Positron emission tomography; Signal design; Switches;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949876