Title :
Spiral Scanning With Improved Control for Faster Imaging of AFM
Author :
Rana, M.S. ; Pota, Hemanshu R. ; Petersen, Ian R.
Author_Institution :
Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
Abstract :
One of the key barriers to an atomic force microscope (AFM) achieving high scanning speeds is its use of the traditional zig-zag raster pattern scanning technique. In this paper, we consider the use of a high-speed spiral imaging technique with an improved multi-input multi-output (MIMO) model predictive control (MPC) scheme with a damping compensator for faster scanning by an AFM. The controller´s design is based on an identified MIMO model of the AFM´s piezoelectric tube scanner (PTS) and it achieves a higher closed-loop bandwidth, significant damping of the resonant mode of the PTS, and reduces the cross-coupling effect between the PTS´s axes. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. To evaluate the performance improvement using this proposed control scheme for spiral scanning, an experimental comparison of its scanned images with those of the open-loop condition is performed. Experimental results show that, by using the proposed method, the AFM´s scanning speed is significantly increased up to 180 Hz.
Keywords :
MIMO systems; atomic force microscopy; damping; predictive control; AFM imaging; AFM piezoelectric tube scanner; atomic force microscope; closed-loop bandwidth; continuous high-speed scanning; controller design; cross-coupling effect; damping compensator; high-speed spiral imaging technique; improved control; improved multi-input multi-output model predictive control scheme; narrow-band frequency; open-loop condition; performance improvement; raster scanning motion; resonant mode damping; spiral scanning; zig-zag raster pattern scanning technique; Capacitive sensors; Damping; Frequency measurement; MIMO; Resonant frequency; Spirals; Atomic force microscope (AFM); damping compensator; model predictive control (MPC); multi-input multi-output (MIMO); raster scan; spiral scan;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2014.2309653