• DocumentCode
    1753196
  • Title

    Nanoassembly and Packaging of Single Carbon Nanotube Based Transistors

  • Author

    Chan, Ho-Yin ; Xi, Ning ; Zhang, Jiangbo ; Li, Guangyong

  • Author_Institution
    Electrical and Computer Engineering, Michigan State University, East Lansing, Michigan, USA, chanho1@msu.edu
  • Volume
    1
  • fYear
    2006
  • fDate
    17-20 June 2006
  • Firstpage
    250
  • Lastpage
    253
  • Abstract
    Carbon nanotube transistor with bottom gate fabricated by atomic force microscopy based nanomanipulation system is presented in this paper. This process consists of fabrication of transistor chips using conventional optical lithography and nanoassembly of CNTs on the chips. It is found that the contact resistance between the CNT and Palladium electrodes can be as low as several hundred kΩ. By using this fabrication technique, high fabrication yield of CNT devices can be achieved. In addition, Polyimide serves as the dielectric layer and the packaging material of the transistor which allows us to modify transistor characteristic, because the Fermi level of CNTs shifted after annealing under vacuum. At low temperature, the polyimide has lower gas permeability and thereby, seals the CNT transistors.
  • Keywords
    atomic force microscopy; carbon nanotube transistors; nanomanipulation; polyimide; Atom optics; Atomic force microscopy; Carbon nanotubes; Contact resistance; Electrodes; Lithography; Optical device fabrication; Packaging; Palladium; Polyimides; atomic force microscopy; carbon nanotube transistors; nanomanipulation; polyimide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
  • Print_ISBN
    1-4244-0077-5
  • Type

    conf

  • DOI
    10.1109/NANO.2006.247621
  • Filename
    1717071