DocumentCode :
1753215
Title :
Cost-Driven Repair of a Nanowire Crossbar Architecture
Author :
Yellambalase, Yadunandana ; Zhang, Shanrui ; Choi, Minsu ; Park, Nohpill ; Lombardi, Fabrizio
Author_Institution :
Dept of ECE, University of Missouri-Rolla, Rolla, MO 65409-0040, USA, ypymy9@umr.edu
Volume :
1
fYear :
2006
fDate :
17-20 June 2006
Firstpage :
347
Lastpage :
350
Abstract :
The recent development of nanoscale materials and assembly techniques has resulting in the manufacturing of high-density computational systems. These systems consist of nanometer-scale elements and are likely to have many manufacturing imperfections (defects); thus, defect-tolerance is considered as one of the most some algorithms for repairing defective crosspoints in a nanoscale crossbar architecture; furthermore we estimate the efficiency and cost-effectiveness of each algorithm. Also, for a given design and manufacturing environment, we propose a cost-driven method to find a balanced solution by which figures of merit such as area, repair time and reconfiguration cost can be taken into account. Probabilistic parameters are utilized in the proposed cost-driven method for added flexibility.
Keywords :
Automatic testing; Carbon nanotubes; Chemicals; Computer architecture; Costs; Manufacturing; Nanoscale devices; Self-assembly; Silicon; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN :
1-4244-0077-5
Type :
conf
DOI :
10.1109/NANO.2006.247648
Filename :
1717098
Link To Document :
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