• DocumentCode
    1753659
  • Title

    Analysis and comparison on roughness at millimetre wave

  • Author

    Yoon, Young-Keun ; Jung, Myoung-won ; Kim, JongHo

  • Author_Institution
    Radio Technol. Res. Dept., ETRI, Daejeon, South Korea
  • fYear
    2011
  • fDate
    13-16 Feb. 2011
  • Firstpage
    1316
  • Lastpage
    1319
  • Abstract
    This paper described for the propagation characteristics due to the rough surface of an object at millimeter wave. The analysis used the high frequency asymptotic approaches such as the ray tracing mechanism and Kirchhoff approximation. In results, the roughness of the surface at millimetre wave may make the deep fading. Therefore, the accuracy of the surface is so important to estimate the radio propagation characteristics at millimetre wave.
  • Keywords
    approximation theory; millimetre wave propagation; ray tracing; surface roughness; Kirchhoff approximation; deep fading; high frequency asymptotic approaches; millimetre wave; radio propagation characteristics; ray tracing mechanism; rough surface; surface roughness; Approximation methods; Optical surface waves; Ray tracing; Rough surfaces; Scattering; Surface roughness; Surface waves; kirchhoff; millimetre; propagation; roughness; wave;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Communication Technology (ICACT), 2011 13th International Conference on
  • Conference_Location
    Seoul
  • ISSN
    1738-9445
  • Print_ISBN
    978-1-4244-8830-8
  • Type

    conf

  • Filename
    5746047