DocumentCode
1753750
Title
Short Duration Voltage Variation Characterization through Wavelet Analysis
Author
Zhang, Yihui ; Zhang, Haiyan
Author_Institution
ChongQing Univ. Sci. & Technol., ChongQing, China
fYear
2011
fDate
25-28 March 2011
Firstpage
1
Lastpage
5
Abstract
A wavelet-based energy content method for short duration voltage variation characterization identification during power quality disturbance is provided in this paper. The main advantage of the proposed scheme is that it uses wavelet analysis to zoom into a high frequency band for the time information, and the fundamental frequency band for the magnitude change. Also, it is shown to be effective even for very short interruption, which is difficult to determine using the RMS method. Compared to other wavelet methods, its low computational requirement makes it suitable for real-time application. Dynamic simulations were used to demonstrate the capability of this method.
Keywords
power supply quality; wavelet transforms; RMS method; power quality disturbance; real time application; short duration voltage variation characterization identification; wavelet-based energy content method; Discrete wavelet transforms; Low pass filters; Power quality; Voltage fluctuations; Wavelet analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Power and Energy Engineering Conference (APPEEC), 2011 Asia-Pacific
Conference_Location
Wuhan
ISSN
2157-4839
Print_ISBN
978-1-4244-6253-7
Type
conf
DOI
10.1109/APPEEC.2011.5748454
Filename
5748454
Link To Document