Title :
Short Duration Voltage Variation Characterization through Wavelet Analysis
Author :
Zhang, Yihui ; Zhang, Haiyan
Author_Institution :
ChongQing Univ. Sci. & Technol., ChongQing, China
Abstract :
A wavelet-based energy content method for short duration voltage variation characterization identification during power quality disturbance is provided in this paper. The main advantage of the proposed scheme is that it uses wavelet analysis to zoom into a high frequency band for the time information, and the fundamental frequency band for the magnitude change. Also, it is shown to be effective even for very short interruption, which is difficult to determine using the RMS method. Compared to other wavelet methods, its low computational requirement makes it suitable for real-time application. Dynamic simulations were used to demonstrate the capability of this method.
Keywords :
power supply quality; wavelet transforms; RMS method; power quality disturbance; real time application; short duration voltage variation characterization identification; wavelet-based energy content method; Discrete wavelet transforms; Low pass filters; Power quality; Voltage fluctuations; Wavelet analysis;
Conference_Titel :
Power and Energy Engineering Conference (APPEEC), 2011 Asia-Pacific
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6253-7
DOI :
10.1109/APPEEC.2011.5748454