• DocumentCode
    1753750
  • Title

    Short Duration Voltage Variation Characterization through Wavelet Analysis

  • Author

    Zhang, Yihui ; Zhang, Haiyan

  • Author_Institution
    ChongQing Univ. Sci. & Technol., ChongQing, China
  • fYear
    2011
  • fDate
    25-28 March 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A wavelet-based energy content method for short duration voltage variation characterization identification during power quality disturbance is provided in this paper. The main advantage of the proposed scheme is that it uses wavelet analysis to zoom into a high frequency band for the time information, and the fundamental frequency band for the magnitude change. Also, it is shown to be effective even for very short interruption, which is difficult to determine using the RMS method. Compared to other wavelet methods, its low computational requirement makes it suitable for real-time application. Dynamic simulations were used to demonstrate the capability of this method.
  • Keywords
    power supply quality; wavelet transforms; RMS method; power quality disturbance; real time application; short duration voltage variation characterization identification; wavelet-based energy content method; Discrete wavelet transforms; Low pass filters; Power quality; Voltage fluctuations; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2011 Asia-Pacific
  • Conference_Location
    Wuhan
  • ISSN
    2157-4839
  • Print_ISBN
    978-1-4244-6253-7
  • Type

    conf

  • DOI
    10.1109/APPEEC.2011.5748454
  • Filename
    5748454