• DocumentCode
    1753960
  • Title

    Using actual equipment data for process prediction in high-mix production

  • Author

    Tsuchiyama, Hirofumi ; Nakata, Hiroyuki ; Sakai, Katsuhisa

  • Author_Institution
    Renesas Electron. Corp., Hitachinaka, Japan
  • fYear
    2010
  • fDate
    18-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The process result prediction by means of equipment indicators is becoming essential technique for more precise process control. The difficulty in high mix production fab is to create the prediction model with insufficient sample size. It is demonstrated by experiments that the prediction model using a conventional method deteriorates its reliability or precision when sample size is smaller, so that the optimized methodologies in accordance with sample size were developed to obtain reliable prediction model. This method is verified using 45-nm Cu-interconnect via resistance prediction and the prediction result is in good match with the electrical characterization.
  • Keywords
    process control; production control; reliability; equipment indicator; mix production fab; process control; process prediction model; reliability; resistance prediction; Integrated circuit modeling; Monitoring; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing (ISSM), 2010 International Symposium on
  • Conference_Location
    Tokyo
  • ISSN
    1523-553X
  • Print_ISBN
    978-1-4577-0392-8
  • Electronic_ISBN
    1523-553X
  • Type

    conf

  • Filename
    5750229