DocumentCode
1753960
Title
Using actual equipment data for process prediction in high-mix production
Author
Tsuchiyama, Hirofumi ; Nakata, Hiroyuki ; Sakai, Katsuhisa
Author_Institution
Renesas Electron. Corp., Hitachinaka, Japan
fYear
2010
fDate
18-20 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
The process result prediction by means of equipment indicators is becoming essential technique for more precise process control. The difficulty in high mix production fab is to create the prediction model with insufficient sample size. It is demonstrated by experiments that the prediction model using a conventional method deteriorates its reliability or precision when sample size is smaller, so that the optimized methodologies in accordance with sample size were developed to obtain reliable prediction model. This method is verified using 45-nm Cu-interconnect via resistance prediction and the prediction result is in good match with the electrical characterization.
Keywords
process control; production control; reliability; equipment indicator; mix production fab; process control; process prediction model; reliability; resistance prediction; Integrated circuit modeling; Monitoring; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing (ISSM), 2010 International Symposium on
Conference_Location
Tokyo
ISSN
1523-553X
Print_ISBN
978-1-4577-0392-8
Electronic_ISBN
1523-553X
Type
conf
Filename
5750229
Link To Document