Intelligent Method of Identifying Degraded State for Electronic Devices Based on Neural Network and Fuzzy Integral

Hot Carrier Degraded(HCD), Electro-Static discharge(ESD) and Time-Dependent Dielectric Breakdown (TDDB) are the main failure modes of electronic devices. Identifying degraded state of electronic devices needs considering the combined effects of various factors. In this paper, On the basis of information such as real-time HCD damage, ESD damage, etc were obtained, with the help of fuzzy integral, which has the unique ability of information fusion, a new intelligent method of identifying degraded state of electronic devices was proposed based on neural network and fuzzy integral. Finally, an experiment based on a certain type of electronic device was introduced in detail, and the effectiveness of the intelligent method proposed in this paper was analyzed and validated by the experiment.