Title :
From Memory Device Cross Section to Data Integrity Figures of Space Mass Memories
Author :
Walter, Dennis ; Herrmann, Markus ; Grurmann, Kai ; Gliem, F.
Author_Institution :
Inst. f. Datentechnik, Tech. Univ. Braunschweig, Braunschweig, Germany
Abstract :
The influence of SEU and SEFI events in 4-Gbit DDR3 SDRAM on the data integrity of an example mass memory with a capacity of 4-Tbit and Single Symbol Error Correcting Reed-Solomon Code is investigated.
Keywords :
DRAM chips; 4-Gbit DDR3 SDRAM; 4-Tbit capacity; SEFI event; SEU event; Single Symbol Error Correcting Reed-Solomon Code; data integrity; memory device cross section; space mass memories; Annealing; Error correction; Error probability; SDRAM; Single event upsets; Space vehicles; Bit error probability; DDR3 SDRAM; Reed–Solomon; SEE; SEFI; SEU; error correction; mass memory; mean time to first uncorrectable error;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2014.2348798
