• DocumentCode
    1754460
  • Title

    From Memory Device Cross Section to Data Integrity Figures of Space Mass Memories

  • Author

    Walter, Dennis ; Herrmann, Markus ; Grurmann, Kai ; Gliem, F.

  • Author_Institution
    Inst. f. Datentechnik, Tech. Univ. Braunschweig, Braunschweig, Germany
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    2547
  • Lastpage
    2554
  • Abstract
    The influence of SEU and SEFI events in 4-Gbit DDR3 SDRAM on the data integrity of an example mass memory with a capacity of 4-Tbit and Single Symbol Error Correcting Reed-Solomon Code is investigated.
  • Keywords
    DRAM chips; 4-Gbit DDR3 SDRAM; 4-Tbit capacity; SEFI event; SEU event; Single Symbol Error Correcting Reed-Solomon Code; data integrity; memory device cross section; space mass memories; Annealing; Error correction; Error probability; SDRAM; Single event upsets; Space vehicles; Bit error probability; DDR3 SDRAM; Reed–Solomon; SEE; SEFI; SEU; error correction; mass memory; mean time to first uncorrectable error;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2348798
  • Filename
    6912021
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1754460