• DocumentCode
    1754570
  • Title

    Cross-Spectrum Analysis-Based Scheme for Multiple Power Quality Disturbance Sensing Device

  • Author

    Dalai, Sovan ; Dey, Debangshu ; Chatterjee, Biswendu ; Chakravorti, Sivaji ; Bhattacharya, Kesab

  • Author_Institution
    Dept. of Electr. Eng., Jadavpur Univ., Kolkata, India
  • Volume
    15
  • Issue
    7
  • fYear
    2015
  • fDate
    42186
  • Firstpage
    3989
  • Lastpage
    3997
  • Abstract
    This paper presents a methodology of cross-wavelet transform aided Fischer linear discriminant analysis (FLDA)-based feature selection and classification for sensing simultaneous occurrence of multiple power quality disturbances. A linear support vector machine is used for classification of the extracted features as it suits well with FLDA. This scheme is implemented in a general purpose microcontroller as a standalone module and the performance of the standalone module for sensing simultaneous occurrence of multiple power quality disturbances is judged by both online and offline testing. Results show that the performance is comparable with the results reported in the literatures. Moreover, the scheme is immune to real life uncorrelated noises due to incorporation of cross spectrum analysis in the feature extraction phase. The present method is generic in nature and can be implemented for any other microcontroller-based applications addressing topologically similar problems.
  • Keywords
    electric sensing devices; feature extraction; feature selection; microcontrollers; power measurement; power supply quality; power system faults; spectral analysis; wavelet transforms; FLDA; Fischer linear discriminant analysis; cross-spectrum analysis-based scheme; cross-wavelet transform; feature classification; feature extraction; feature selection; linear support vector machine; microcontroller; multiple power quality disturbance sensing device; Feature extraction; Microcontrollers; Noise; Power quality; Sensors; Support vector machines; Transforms; Cross wavelet Transform; Fischer linear discriminant analysis; Microcontroller; Multiple Power Quality disturbance; Standalone module; Support Vector Machine; cross wavelet transform; microcontroller; multiple power quality disturbance; standalone module; support vector machine;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2014.2377775
  • Filename
    6983525