DocumentCode :
17546
Title :
Fast 3-D Electrothermal Device/Circuit Simulation of Power Superjunction MOSFET Based on SDevice and HSPICE Interaction
Author :
Chvala, Ales ; Donoval, Daniel ; Marek, Jiri ; Pribytny, Patrik ; Molnar, Miklos ; Mikolasek, M.
Author_Institution :
Inst. of Electron. & Photonics, Slovak Univ. of Technol. in Bratislava, Bratislava, Slovakia
Volume :
61
Issue :
4
fYear :
2014
fDate :
Apr-14
Firstpage :
1116
Lastpage :
1122
Abstract :
Automated interaction of SDevice and HSPICE for fast 3-D electrothermal simulation based on the relaxation method is designed. The results are compared with device finite element model simulation and a direct method with an equivalent thermal 3-D RC network. The features and limitations of the methods are analyzed and presented. The designed electrothermal simulation based on the relaxation method is developed for Synopsys TCAD Sentaurus environment for decreasing the simulation time for complex 3-D devices. A power vertical superjunction MOSFET under an unclamped inductive switching test of device robustness is used to perform validation of the designed electrothermal simulation.
Keywords :
SPICE; power MOSFET; technology CAD (electronics); HSPICE; SDevice; Synopsys TCAD Sentaurus environment; equivalent thermal 3-D RC network; fast 3-D electrothermal device/circuit simulation; power superjunction MOSFET; relaxation method; unclamped inductive switching test; Finite element analysis; Integrated circuit modeling; MOSFET; Relaxation methods; Semiconductor device modeling; Semiconductor process modeling; Solid modeling; 3-D electrothermal simulation; HSPICE; SDevice; superjunction MOSFET; unclamped inductive switching (UIS) test;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2014.2305848
Filename :
6755550
Link To Document :
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